HVEM/AFM Observation of Hinge-Type Plastic Zones Associated with Cracks in Silicon Crystals
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منابع مشابه
HVEM/AFM Observation of Hinge-Type Plastic Zones Associated with Cracks in Silicon Crystals
Dislocation structures developed in hinge-type plastic zones associated with cracks in silicon crystals have been studied using a high voltage electron microscope (HVEM). Fine slip bands due to those dislocations have been also examined by an atomic force microscope (AFM). {100} and {110} cracks were introduced into {110} silicon wafers at room temperature by Vickers indentation method. The tem...
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ژورنال
عنوان ژورنال: MATERIALS TRANSACTIONS
سال: 2002
ISSN: 1345-9678,1347-5320
DOI: 10.2320/matertrans.43.2169